Title :
A 11.1-bit ENOB 50-MS/s pipelined A/D converter in 130-nm CMOS without S/H front end
Author :
Treichler, Jürg ; Huang, Qiuting
Author_Institution :
Integrated Syst. Lab., ETH Zurich, Zurich, Switzerland
Abstract :
This paper describes the implementation of a 14-bit pipelined analog-to-digital converter (ADC) operating at a sampling frequency of 50MS/s with an effective resolution of 11.1 bit at Nyquist rate, fabricated in a 130-nm technology with a supply voltage of 1.2 volts and a power consumption of less than 110 mW. The ADC consists of differently scaled 1.5-bit pipeline stages only and dispenses with the sample-and-hold (S/H) front-end circuit. While a calibration algorithm measures and digitally compensates for possible capacitor mismatch in the foremost stages, self-calibrating comparators improve the accuracy of the initial stage, and a self-calibrating delay line creates additional clock edges that are delayed with respect to the master clock by a time lag proportional to the sampling period.
Keywords :
CMOS integrated circuits; analogue-digital conversion; comparators (circuits); sample and hold circuits; A/D converter; ADC; CMOS; ENOB; Nyquist rate; analog-to-digital converter; calibration algorithm; sample-and-hold front-end circuit; self-calibrating comparator; size 130 nm; voltage 1.2 V; CMOS integrated circuits; Calibration; Clocks; Converters; Pipelines; Signal to noise ratio;
Conference_Titel :
ESSCIRC, 2010 Proceedings of the
Conference_Location :
Seville
Print_ISBN :
978-1-4244-6662-7
DOI :
10.1109/ESSCIRC.2010.5619721