• DocumentCode
    2821159
  • Title

    A 11.1-bit ENOB 50-MS/s pipelined A/D converter in 130-nm CMOS without S/H front end

  • Author

    Treichler, Jürg ; Huang, Qiuting

  • Author_Institution
    Integrated Syst. Lab., ETH Zurich, Zurich, Switzerland
  • fYear
    2010
  • fDate
    14-16 Sept. 2010
  • Firstpage
    374
  • Lastpage
    377
  • Abstract
    This paper describes the implementation of a 14-bit pipelined analog-to-digital converter (ADC) operating at a sampling frequency of 50MS/s with an effective resolution of 11.1 bit at Nyquist rate, fabricated in a 130-nm technology with a supply voltage of 1.2 volts and a power consumption of less than 110 mW. The ADC consists of differently scaled 1.5-bit pipeline stages only and dispenses with the sample-and-hold (S/H) front-end circuit. While a calibration algorithm measures and digitally compensates for possible capacitor mismatch in the foremost stages, self-calibrating comparators improve the accuracy of the initial stage, and a self-calibrating delay line creates additional clock edges that are delayed with respect to the master clock by a time lag proportional to the sampling period.
  • Keywords
    CMOS integrated circuits; analogue-digital conversion; comparators (circuits); sample and hold circuits; A/D converter; ADC; CMOS; ENOB; Nyquist rate; analog-to-digital converter; calibration algorithm; sample-and-hold front-end circuit; self-calibrating comparator; size 130 nm; voltage 1.2 V; CMOS integrated circuits; Calibration; Clocks; Converters; Pipelines; Signal to noise ratio;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ESSCIRC, 2010 Proceedings of the
  • Conference_Location
    Seville
  • ISSN
    1930-8833
  • Print_ISBN
    978-1-4244-6662-7
  • Type

    conf

  • DOI
    10.1109/ESSCIRC.2010.5619721
  • Filename
    5619721