• DocumentCode
    2821365
  • Title

    Probabilistic Inference to the Problem of Inverse-halftoning based on Statistical Mechanics of the Q-Ising Model

  • Author

    Saika, Yohei ; Inoue, Jun-ichi

  • Author_Institution
    Wakayama Nat. Coll. of Technol.
  • fYear
    2007
  • fDate
    1-5 April 2007
  • Firstpage
    429
  • Lastpage
    433
  • Abstract
    On the basis of statistical mechanics of the Q-Ising model, we formulate the problem of inverse-halftoning using the maximizer of the posterior marginal (MPM) estimate for halftone images obtained by the threshold mask method. Then, we estimate the performance of the method in terms of the mean square error and the histogram of the gray-level using the Markov-chain Monte Carlo simulation. The simulation for a set of snapshots of the Q-Ising model reveals the results that the MPM estimate works effectively for the problem of inverse-halftoning, if we appropriately set the parameters of the model prior expressed by the Boltzmann factor of the Q-Ising model. We then clarify that the model prior shifts the gray-level images from both sides to the middle range of the gray-level in the procedure of inverse-halftoning. Also, these properties are confirmed by the MCMC method even for real-world images.
  • Keywords
    Markov processes; Monte Carlo methods; image processing; inference mechanisms; mean square error methods; statistical mechanics; Boltzmann factor; Markov-chain Monte Carlo simulation; Q-Ising model; halftone images; inverse-halftoning; mean square error; posterior marginal estimate; probabilistic inference; statistical mechanics; threshold mask; Computational intelligence; Error correction codes; Histograms; Image analysis; Image generation; Image restoration; Informatics; Information processing; Low pass filters; Mean square error methods; Monte Carlo simulation; inverse-halftoning; statistical mechanics; the Bayes inference;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Foundations of Computational Intelligence, 2007. FOCI 2007. IEEE Symposium on
  • Conference_Location
    Honolulu, HI
  • Print_ISBN
    1-4244-0703-6
  • Type

    conf

  • DOI
    10.1109/FOCI.2007.371507
  • Filename
    4233941