Automated generation of SPICE characterization test masks and test databases

Author

Kasel, Leo ; McAndrew, Colin C. ; Drennan, Patrick ; Davis, William F. ; Ida, Richard

Author_Institution

Motorola Inc., Tempe, AZ, USA

fYear

1999

fDate

1999

Firstpage

74

Lastpage

79

Abstract

This paper presents procedures and software tools for automatic generation of test masks, and mask and measurement databases, for SPICE model characterization. The process uses Cadence Pcells, and requires user specification only of a small amount of biasing information. The tools generate device instances, place and route the devices, extract test array coordinates and contents from layout for auto-probing, generate measurement test plans, and generate test mask documentation

Keywords

SPICE; integrated circuit layout; integrated circuit modelling; integrated circuit testing; masks; network routing; software tools; visual databases; Cadence Pcells; IC layout; SPICE characterization test databases; SPICE characterization test masks; SPICE model characterization; auto-probing; automated SPICE characterization test database generation; automated SPICE characterization test mask generation; biasing information; device instances; device placement; device routing; mask databases; measurement databases; measurement test plans; software tools; test array contents; test array coordinates; test mask documentation; user specification; Automatic testing; Character generation; Coordinate measuring machines; Data mining; Databases; Documentation; SPICE; Software measurement; Software testing; Software tools;

fLanguage

English

Publisher

ieee

Conference_Titel

Microelectronic Test Structures, 1999. ICMTS 1999. Proceedings of the 1999 International Conference on

Conference_Location

Goteborg

Print_ISBN

0-7803-5270-X

Type

conf

DOI

10.1109/ICMTS.1999.766219

Filename

766219