Title :
Study of radiation effects on low voltage memories
Author :
Doucin, B. ; Poivey, C. ; Carlotti, C. ; Salminen, A. ; Ojasalo, K. ; Ahonen, R. ; Poirot, P. ; Baudry, L. ; Sorensen, R. Harboe
Author_Institution :
Matra Marconi Space, Velizy, France
Abstract :
Total Dose, heavy ion and proton irradiation were performed on 6 types of commercial memories (two 1 Mbit SRAMs, two 16 Mbit DRAMs, two 8 Mbit Flash memories), in order to evidence the effect of power supply on the results
Keywords :
DRAM chips; SRAM chips; flash memories; ion beam effects; low-power electronics; proton effects; 1 Mbit; 16 Mbit; 8 Mbit; DRAM; SRAM; flash memory; heavy ion irradiation; low voltage memory; power supply; proton irradiation; radiation effect; total dose; Automation; Flash memory; Low voltage; Microwave integrated circuits; Performance evaluation; Power supplies; Protons; Radiation effects; Random access memory; System testing;
Conference_Titel :
Radiation and Its Effects on Components and Systems, 1997. RADECS 97. Fourth European Conference on
Conference_Location :
Cannes
Print_ISBN :
0-7803-4071-X
DOI :
10.1109/RADECS.1997.699001
