DocumentCode
2821473
Title
Study of radiation effects on low voltage memories
Author
Doucin, B. ; Poivey, C. ; Carlotti, C. ; Salminen, A. ; Ojasalo, K. ; Ahonen, R. ; Poirot, P. ; Baudry, L. ; Sorensen, R. Harboe
Author_Institution
Matra Marconi Space, Velizy, France
fYear
1997
fDate
15-19 Sep 1997
Firstpage
561
Lastpage
569
Abstract
Total Dose, heavy ion and proton irradiation were performed on 6 types of commercial memories (two 1 Mbit SRAMs, two 16 Mbit DRAMs, two 8 Mbit Flash memories), in order to evidence the effect of power supply on the results
Keywords
DRAM chips; SRAM chips; flash memories; ion beam effects; low-power electronics; proton effects; 1 Mbit; 16 Mbit; 8 Mbit; DRAM; SRAM; flash memory; heavy ion irradiation; low voltage memory; power supply; proton irradiation; radiation effect; total dose; Automation; Flash memory; Low voltage; Microwave integrated circuits; Performance evaluation; Power supplies; Protons; Radiation effects; Random access memory; System testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Radiation and Its Effects on Components and Systems, 1997. RADECS 97. Fourth European Conference on
Conference_Location
Cannes
Print_ISBN
0-7803-4071-X
Type
conf
DOI
10.1109/RADECS.1997.699001
Filename
699001
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