• DocumentCode
    2822012
  • Title

    Author index

  • fYear
    1999
  • fDate
    18-18 March 1999
  • Firstpage
    233
  • Lastpage
    234
  • Abstract
    The author index contains an entry for each author and coauthor included in the proceedings record.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronic Test Structures, 1999. ICMTS 1999. Proceedings of the 1999 International Conference on
  • Conference_Location
    Goteborg, Sweden
  • Print_ISBN
    0-7803-5270-X
  • Type

    conf

  • DOI
    10.1109/ICMTS.1999.766250
  • Filename
    766250
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2822012