Title :
A Method of Test Case Automatic Generation for Embedded Software
Author :
Yin, Yongfeng ; Liu, Bin
Author_Institution :
Dept. of Syst. Eng. of Eng. Technol., Beijing Univ. of Aeronaut. & Astronaut., Beijing, China
Abstract :
At present, embedded software testing automation is a hot topic and the test case automatic generation is one of the key problems. In this paper, UML and scenario technology are introduced into embedded software testing field. Based on the formal definition and testing coverage criteria of testing scenario, the description method of testing scenario based on UML activity diagram is studied firstly. And then, the generation algorithm of testing scenario and test case are put forward and the problem of test case automatic generation for embedded software is solved. With the successful application of the method in actual avionics embedded software testing, the correctness and effectiveness of the method are validated.
Keywords :
Unified Modeling Language; embedded systems; program testing; UML activity diagram; avionics embedded software testing; embedded software testing automation; test case automatic generation; testing coverage criteria; testing scenario generation algorithm; unified modeling language; Aerospace electronics; Aerospace testing; Application software; Automatic testing; Embedded software; Software testing; Space technology; System testing; Systems engineering and theory; Unified modeling language;
Conference_Titel :
Information Engineering and Computer Science, 2009. ICIECS 2009. International Conference on
Conference_Location :
Wuhan
Print_ISBN :
978-1-4244-4994-1
DOI :
10.1109/ICIECS.2009.5363631
