DocumentCode
2822061
Title
A new yield optimization algorithm and its applications
Author
Wang, Zhihua ; Yang, Huazhong ; Liu, RenSheng ; Fan, Chongzhi
Author_Institution
Dept. of Electron. Eng., Tsinghua Univ., Beijing, China
fYear
1991
fDate
11-14 Jun 1991
Firstpage
1996
Abstract
The authors propose a novel yield optimization algorithm for IC design. To design a practical yield optimization system, two efforts must be made. One is to get a suitable convergence criterion, the other is to propose an efficient optimization method, by which one can reach the maximum yield point as soon as possible. A convergence criterion based on sequential tests of a hypothesis is presented. This algorithm was implemented in a CADS (computer-aided design system). Applications of this algorithm show its high efficiency
Keywords
circuit CAD; circuit layout CAD; electronic engineering computing; integrated circuit manufacture; optimisation; CADS; IC design; computer-aided design system; convergence criterion; optimization method; sequential tests; yield optimization algorithm; Algorithm design and analysis; Application software; Circuits; Convergence; Design automation; Design engineering; Design optimization; Equations; Optimization methods; Yield estimation;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems, 1991., IEEE International Sympoisum on
Print_ISBN
0-7803-0050-5
Type
conf
DOI
10.1109/ISCAS.1991.176055
Filename
176055
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