Title :
Proceedings. 2nd IEEE Workshop on Industrial Strength Formal Specification Techniques
Abstract :
The following topics were dealt with: what does industry need from formal specification techniques?; selection criteria for automated TTCN test case generation from SDL; using the SCR* toolset to specify software requirements; applying SOFL to specify a railway crossing controller for industry; adding real-time filters to object-oriented specification of time-critical systems; formal techniques for automatically generating marshalling code from high-level specifications; integrating formal and informal specification techniques (why and how); formal methods for developing high-assurance computer systems; a discussion about integrated techniques; the industrial use of formal methods (was Darwin right?); AETGSM Web (a Web-based service for automatic efficient test generation from functional requirements); T-VECTM product summary; implementing Statecharts in Promela/SPIN; reasoning with UML class diagrams; a tool for automatic test generation from SDL specifications; transferring formal methods technology to industry; incorporating formal methods into industrial processes; requirements for industrial-strength formal method tools; and "pushbutton" analysis via integration of industrial tools with formal validation.
Keywords :
formal specification; AETG Web; Promela; SCR* toolset; SDL; SOFL; SPIN; Statecharts; T-VEC; UML class diagrams; World Wide Web-based service; automated TTCN test case generation; automatic code generation; formal validation; functional requirements; high-assurance computer systems; high-level specifications; industrial processes; industrial-strength formal specification; informal specification techniques; integrated techniques; marshalling code; object-oriented specification; pushbutton analysis; railway crossing controller; real-time filters; selection criteria; software requirements; technology transfer; time-critical systems;
Conference_Titel :
Industrial Strength Formal Specification Techniques, 1998. Proceedings. 2nd IEEE Workshop on
Conference_Location :
Boca Raton, FL, USA
Print_ISBN :
0-7695-0081-1
DOI :
10.1109/WIFT.1998.766284