DocumentCode :
2822599
Title :
A 65-nm CMOS temperature-compensated mobility-based frequency reference for Wireless Sensor Networks
Author :
Sebastiano, Fabio ; Breems, Lucien ; Makinwa, Kofi ; Drago, Salvatore ; Leenaerts, Domine ; Nauta, Bram
Author_Institution :
NXP Semicond., Eindhoven, Netherlands
fYear :
2010
fDate :
14-16 Sept. 2010
Firstpage :
102
Lastpage :
105
Abstract :
For the first time, a temperature-compensated CMOS frequency reference based on the electron mobility in a MOS transistor is presented. Over the temperature range from -55°C to 125 °C, its frequency spread is less than ±0.5% after a two-point trim and less than ±2.7% after a one-point trim. These results make it suitable for use in Wireless Sensor Network nodes. Fabricated in a baseline 65-nm CMOS process, the 150 kHz frequency reference occupies 0.2 mm2 and draws 42.6 μA from a 1.2-V supply at room temperature.
Keywords :
CMOS integrated circuits; MOSFET; electron mobility; wireless sensor networks; CMOS temperature-compensated mobility; MOS transistor; current 42.6 muA; electron mobility; frequency 150 kHz; frequency reference; size 65 nm; temperature -55 C to 125 C; voltage 1.2 V; wireless sensor network; Accuracy; CMOS integrated circuits; Calibration; Oscillators; Temperature measurement; Temperature sensors; Wireless sensor networks;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
ESSCIRC, 2010 Proceedings of the
Conference_Location :
Seville
ISSN :
1930-8833
Print_ISBN :
978-1-4244-6662-7
Type :
conf
DOI :
10.1109/ESSCIRC.2010.5619792
Filename :
5619792
Link To Document :
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