• DocumentCode
    2822688
  • Title

    Study of task profile oriented embedded software test aiming to improve reliability

  • Author

    Wu, Yumei ; Yu, Zhengwei ; Liu, Zhifang

  • Author_Institution
    Dept. of Syst. Eng., Beihang Univ., Beijing, China
  • Volume
    2
  • fYear
    2010
  • fDate
    21-24 May 2010
  • Abstract
    Software test has become a very effective way to find software defects and improve software quality especially reliability. Study of the embedded software test has been receiving more consideration from researchers and engineers for its special characteristics. In this paper software task profile is proposed to give the accurate and complete description of the complicated interactions and time sequences within embedded software. It also ensures test cases generated based on it can be running in actual embedded software systems and related information such as task characteristics and task state can be collected. Strategies based on the state coverage are presented to implement the software test process and accelerate the process by dividing the whole process into stabilizing and controlling ones, at the same time task reliability based on an engineering algorithm can be quantitatively calculated not by software failure data which are used in conventional reliability test but by the statistics of the contribution of task attributes.
  • Keywords
    program testing; software quality; software reliability; engineering algorithm; software defects; software failure data; software quality; task profile oriented embedded software test; task reliability; time sequences; Character generation; Data engineering; Embedded software; Life estimation; Reliability engineering; Software algorithms; Software quality; Software testing; Statistical analysis; System testing; embedded software; software reliability test; software task reliability; task profile;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Future Computer and Communication (ICFCC), 2010 2nd International Conference on
  • Conference_Location
    Wuhan
  • Print_ISBN
    978-1-4244-5821-9
  • Type

    conf

  • DOI
    10.1109/ICFCC.2010.5497290
  • Filename
    5497290