• DocumentCode
    2822805
  • Title

    Autolink-a tool for automatic test generation from SDL specifications

  • Author

    Koch, Beat ; Grabowski, Jens ; Hogrefe, Dieter ; Schmitt, Michael

  • Author_Institution
    Inst. fur Telematics., Lubeck Univ., Germany
  • fYear
    1998
  • fDate
    1998
  • Firstpage
    114
  • Lastpage
    125
  • Abstract
    Due to an increasing interest in SDL (Specification and Description Language), MSC (Message Sequence Charts) and TTCN (Tree and Tabular Combined Notation) based tools for validation and test generation, Telelogic AB and the Institute for Telematics at the University of Lübeck are cooperating in a research and development project which adds new test generation facilities to Telelogic´s Tau tool set. The result of that cooperation is Autolink, a software tool which supports the automatic generation of TTCN test suites based on SDL and MSC specifications. The project follows a pragmatic approach and is driven by practical experience. Autolink has been used by the European Telecommunications Standards Institute (ETSI) to develop a test suite for Core INAP CS-2 (Intelligent Network Application Protocol, Capability Set 2)
  • Keywords
    automatic test software; conformance testing; formal specification; software standards; software tools; specification languages; Autolink; Core INAP CS-2; ETSI; European Telecommunications Standards Institute; Intelligent Network Application Protocol, Capability Set 2; MSC specifications; Message Sequence Charts; SDL specifications; Specification and Description Language; TTCN test suites; Tau tool set; Telelogic; Tree and Tabular Combined Notation; automatic test generation tool; conformance testing; software validation; Automatic testing; Electrical capacitance tomography; Research and development; Specification languages; Standards development; System testing; Telecommunication standards; Telematics; Tellurium; Test equipment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Industrial Strength Formal Specification Techniques, 1998. Proceedings. 2nd IEEE Workshop on
  • Conference_Location
    Boca Raton, FL
  • Print_ISBN
    0-7695-0081-1
  • Type

    conf

  • DOI
    10.1109/WIFT.1998.766305
  • Filename
    766305