• DocumentCode
    2823076
  • Title

    Noise prediction and measurement in SC networks

  • Author

    Campbell, CRW ; Reineck, KM ; Stephenson, FW

  • Author_Institution
    Tran Syst. Ltd., Stellenbosch, South Africa
  • fYear
    1990
  • fDate
    12-14 Aug 1990
  • Firstpage
    960
  • Abstract
    Noise generation in SC networks differs from that of RC-active networks. Not only is the noise subject to sampling effects as in sampled-data circuits, but certain noise sources are unique to SC networks. In the study of the noise performance of an SC circuit and in the application of noise-reduction techniques, an in-depth understanding is essential. The current status of noise analysis and reduction in SC networks is reviewed, and the need for SC simulation programs to routinely include comprehensive noise analysis is stressed
  • Keywords
    circuit analysis computing; electric noise measurement; electron device noise; switched capacitor networks; SC networks; noise analysis; noise generation; noise measurement; noise prediction; noise sources; noise-reduction techniques; sampling effects; 1f noise; Circuit noise; Circuit simulation; Computational modeling; Filters; Intelligent networks; Noise generators; Noise measurement; Noise reduction; Time domain analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems, 1990., Proceedings of the 33rd Midwest Symposium on
  • Conference_Location
    Calgary, Alta.
  • Print_ISBN
    0-7803-0081-5
  • Type

    conf

  • DOI
    10.1109/MWSCAS.1990.140883
  • Filename
    140883