Title :
Noise prediction and measurement in SC networks
Author :
Campbell, CRW ; Reineck, KM ; Stephenson, FW
Author_Institution :
Tran Syst. Ltd., Stellenbosch, South Africa
Abstract :
Noise generation in SC networks differs from that of RC-active networks. Not only is the noise subject to sampling effects as in sampled-data circuits, but certain noise sources are unique to SC networks. In the study of the noise performance of an SC circuit and in the application of noise-reduction techniques, an in-depth understanding is essential. The current status of noise analysis and reduction in SC networks is reviewed, and the need for SC simulation programs to routinely include comprehensive noise analysis is stressed
Keywords :
circuit analysis computing; electric noise measurement; electron device noise; switched capacitor networks; SC networks; noise analysis; noise generation; noise measurement; noise prediction; noise sources; noise-reduction techniques; sampling effects; 1f noise; Circuit noise; Circuit simulation; Computational modeling; Filters; Intelligent networks; Noise generators; Noise measurement; Noise reduction; Time domain analysis;
Conference_Titel :
Circuits and Systems, 1990., Proceedings of the 33rd Midwest Symposium on
Conference_Location :
Calgary, Alta.
Print_ISBN :
0-7803-0081-5
DOI :
10.1109/MWSCAS.1990.140883