• DocumentCode
    2823127
  • Title

    Ion track lithography: novel low-cost process to form deep vertical and high aspect ratio MEMS in flexible laminates

  • Author

    Majjad, H. ; Lindeberg, M. ; Skupinski, M. ; Hjort, K.

  • Author_Institution
    Angstrom Lab., Uppsala Univ., Sweden
  • fYear
    2003
  • fDate
    5-7 May 2003
  • Firstpage
    318
  • Lastpage
    323
  • Abstract
    High aspect ratio microstructures are today of utterly importance in MEMS. The process described in this paper can be used to produce deep, vertical microstructures in polyimide based materials, used in e.g. flexible printed circuit boards (FPCBs). Stacked polyimide and metal layers have the potential of integrating microelectronic circuits with above applications. The process is capable of producing regions with perpendicular sub-micron metal wire connections at numerous, arbitrarily specified locations. The flexible laminate is irradiated with heavy ions creating a vertical damage anisotropy (ion tracks) in the polymer layer. Lithographically defined apertures in the metallic layer define the geometry. The tracks exposed are selectively developed forming nanometer-wide pores. Metallic structures have been replicated in these pores by electrodeposition of metals. Demonstrator microstructures and highly vertical, through hole microvias have been fabricated. Ion track technology is promising for ultra-high density via batch production and has a potential of further miniaturizing via dimensions.
  • Keywords
    crystal microstructure; electrodeposition; integrated circuits; ion beam effects; ion beam lithography; laminates; micromechanical devices; polymer structure; polymers; printed circuits; MEMS; damage anisotropy; electrodeposition; flexible laminates; flexible printed circuit boards; integrating microelectronic circuits; ion beam effects; ion track lithography; metal layers; microstructures; polyimide based materials; stacked polyimide; submicron metal wire connections; Anisotropic magnetoresistance; Flexible printed circuits; Laminates; Lithography; Microelectronics; Micromechanical devices; Microstructure; Polyimides; Polymers; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design, Test, Integration and Packaging of MEMS/MOEMS 2003. Symposium on
  • Print_ISBN
    0-7803-7066-X
  • Type

    conf

  • DOI
    10.1109/DTIP.2003.1287060
  • Filename
    1287060