DocumentCode
2823172
Title
A 160×120-pixel uncooled IR-FPA readout integrated circuit with on-chip non-uniformity compensation
Author
Perenzoni, Matteo ; Mosconi, Daniel ; Stoppa, David
Author_Institution
Center for Mater. & Microsyst., Fondazione Bruno Kessler, Trento, Italy
fYear
2010
fDate
14-16 Sept. 2010
Firstpage
122
Lastpage
125
Abstract
This paper describes the development of a readout integrated circuit coupled to a 160×120-pixels infrared focal plane array (IR-FPA) based on micro-bolometric detectors. The readout circuit includes 5-bit in-pixel memory and dedicated circuitry for automatic calibration of the array offset non-uniformity, 8 selectable columns of reference pixels, and four high-sensitivity temperature sensors to monitor FPA temperature. The integrated circuit has been fabricated in a standard CMOS 0.5μm 2P3M 3.3/5V technology and subsequently processed to build the vanadium oxide bolometers having a pitch of 52μm. Electrical and electro-optical tests have been performed: the chip operates at 50fps with NETD=0.33K (dynamic vacuum, optics with F/#=1.2) dissipating 80mW, with up to 32x offset reduction.
Keywords
CMOS image sensors; bolometers; focal planes; integrated circuit testing; readout electronics; CMOS technology; FPA temperature; IR-FPA readout integrated circuit; automatic calibration; dedicated circuitry; electrical test; electrooptical test; infrared focal plane array; microbolometric detector; on-chip nonuniformity compensation; pixel memory; size 0.5 mum; vanadium oxide bolometer; Arrays; Bolometers; Calibration; Generators; Integrated circuits; Pixel; Temperature sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
ESSCIRC, 2010 Proceedings of the
Conference_Location
Seville
ISSN
1930-8833
Print_ISBN
978-1-4244-6662-7
Type
conf
DOI
10.1109/ESSCIRC.2010.5619821
Filename
5619821
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