• DocumentCode
    2823172
  • Title

    A 160×120-pixel uncooled IR-FPA readout integrated circuit with on-chip non-uniformity compensation

  • Author

    Perenzoni, Matteo ; Mosconi, Daniel ; Stoppa, David

  • Author_Institution
    Center for Mater. & Microsyst., Fondazione Bruno Kessler, Trento, Italy
  • fYear
    2010
  • fDate
    14-16 Sept. 2010
  • Firstpage
    122
  • Lastpage
    125
  • Abstract
    This paper describes the development of a readout integrated circuit coupled to a 160×120-pixels infrared focal plane array (IR-FPA) based on micro-bolometric detectors. The readout circuit includes 5-bit in-pixel memory and dedicated circuitry for automatic calibration of the array offset non-uniformity, 8 selectable columns of reference pixels, and four high-sensitivity temperature sensors to monitor FPA temperature. The integrated circuit has been fabricated in a standard CMOS 0.5μm 2P3M 3.3/5V technology and subsequently processed to build the vanadium oxide bolometers having a pitch of 52μm. Electrical and electro-optical tests have been performed: the chip operates at 50fps with NETD=0.33K (dynamic vacuum, optics with F/#=1.2) dissipating 80mW, with up to 32x offset reduction.
  • Keywords
    CMOS image sensors; bolometers; focal planes; integrated circuit testing; readout electronics; CMOS technology; FPA temperature; IR-FPA readout integrated circuit; automatic calibration; dedicated circuitry; electrical test; electrooptical test; infrared focal plane array; microbolometric detector; on-chip nonuniformity compensation; pixel memory; size 0.5 mum; vanadium oxide bolometer; Arrays; Bolometers; Calibration; Generators; Integrated circuits; Pixel; Temperature sensors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ESSCIRC, 2010 Proceedings of the
  • Conference_Location
    Seville
  • ISSN
    1930-8833
  • Print_ISBN
    978-1-4244-6662-7
  • Type

    conf

  • DOI
    10.1109/ESSCIRC.2010.5619821
  • Filename
    5619821