Title :
Field theory analysis of five port annular microstrip junction
Author :
Omer, W. ; Salem, D. ; Mohra, A. ; Hashish, E.
Abstract :
The five-port annular junction is solved using field theory analysis with the aid of finite elements method. Novel model for fringing fields is presented. Fields distributions and scattering matrices are obtained. Two five-port microstrip annular junctions are simulated using IE3D, realized and the measured S-parameters are found to be in good agreement with theoretical ones.
Keywords :
S-matrix theory; S-parameters; finite element analysis; microstrip resonators; multiport networks; waveguide theory; IE3D simulation; S-parameters; field theory analysis; fields distributions; finite elements method; five port annular microstrip junction; fringing fields; scattering matrices; Finite element methods; Green´s function methods; Impedance; Magnetic field measurement; Maxwell equations; Microstrip; Resonant frequency; Scattering; Transmission line matrix methods; Waveguide junctions;
Conference_Titel :
Circuits and Systems, 2003 IEEE 46th Midwest Symposium on
Print_ISBN :
0-7803-8294-3
DOI :
10.1109/MWSCAS.2003.1562506
