Title :
Accurate distortion measurement for B-spline-based shape coding
Author :
Lai, Zhongyuan ; Zuo, Zhen ; Wang, Zhe ; Yao, Zhijun ; Liu, Wenyu
Author_Institution :
Dept. of Electron. & Inf. Eng., Huazhong Univ. of Sci. & Technol., Wuhan, China
Abstract :
In this paper, we present a new contour point distortion measurement, called accurate distortion measurement for B-spline-based shape coding (ADMBSC). Different from existing distortion measurements containing approximation, quantization or parameterization, our distortion is defined as the shortest distance from the original B-spline to the associated contour point. This is in line with the subjective-based objective quality metric. Geometric relationships are introduced to simplify computation, followed by a hybrid admissible distortion checking algorithm to reduce execution time. Theoretical analysis and experimental results demonstrate that when the operational rate-distortion optimal shape coding framework under the minimum-maximum criterion is applied, the ADMBSC can lead to the smallest bit-rate among all the distortion measurements that can guarantee the admissible distortion. Moreover, if the original contour has NC points, it takes only O(NC) time for segment distortion measuring paradigms, whose computational complexity is the same as the lowest one among the existing distortion measurements.
Keywords :
computational complexity; distortion; image coding; minimax techniques; shape recognition; splines (mathematics); B-spline-based shape coding; computational complexity; contour point distortion measurement; hybrid admissible distortion checking algorithm; minimum-maximum criterion; operational rate-distortion optimal shape coding framework; segment distortion measuring paradigms; subjective-based objective quality metric; Computational modeling; Distortion measurement; Encoding; Image coding; Mathematical model; Shape; Spline; Video coding; image coding; image quality;
Conference_Titel :
Image Processing (ICIP), 2011 18th IEEE International Conference on
Conference_Location :
Brussels
Print_ISBN :
978-1-4577-1304-0
Electronic_ISBN :
1522-4880
DOI :
10.1109/ICIP.2011.6116088