DocumentCode :
2824605
Title :
Charge injection in analog-to-digital converters
Author :
Mayes, Michael K. ; Chen, Ray R.
Author_Institution :
National Semiconductor Corp., Santa Clara, CA, USA
fYear :
1991
fDate :
11-14 Jun 1991
Firstpage :
3086
Abstract :
Charge injection cancellation techniques using inverter delays to stagger the auto zero signals of multistage comparators exhibit varied offsets over supply, process, and temperature. Typically, these variations result from insufficient delay times between auto zero signals. By replacing the inverter delays with a programmable delay circuit, a better understanding of delay vs. offset is achieved
Keywords :
CMOS integrated circuits; MOS integrated circuits; analogue-digital conversion; ADCs; analog-to-digital converters; charge injection cancellation techniques; delay/offset characteristic; inverter delays; multistage comparators; programmable delay circuit; staggered auto zero signals; Analog integrated circuits; Analog-digital conversion; Capacitance; Clocks; Delay; Feeds; MOSFETs; Switches; Switching circuits; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems, 1991., IEEE International Sympoisum on
Print_ISBN :
0-7803-0050-5
Type :
conf
DOI :
10.1109/ISCAS.1991.176200
Filename :
176200
Link To Document :
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