Title : 
Charge injection in analog-to-digital converters
         
        
            Author : 
Mayes, Michael K. ; Chen, Ray R.
         
        
            Author_Institution : 
National Semiconductor Corp., Santa Clara, CA, USA
         
        
        
        
        
            Abstract : 
Charge injection cancellation techniques using inverter delays to stagger the auto zero signals of multistage comparators exhibit varied offsets over supply, process, and temperature. Typically, these variations result from insufficient delay times between auto zero signals. By replacing the inverter delays with a programmable delay circuit, a better understanding of delay vs. offset is achieved
         
        
            Keywords : 
CMOS integrated circuits; MOS integrated circuits; analogue-digital conversion; ADCs; analog-to-digital converters; charge injection cancellation techniques; delay/offset characteristic; inverter delays; multistage comparators; programmable delay circuit; staggered auto zero signals; Analog integrated circuits; Analog-digital conversion; Capacitance; Clocks; Delay; Feeds; MOSFETs; Switches; Switching circuits; Voltage;
         
        
        
        
            Conference_Titel : 
Circuits and Systems, 1991., IEEE International Sympoisum on
         
        
            Print_ISBN : 
0-7803-0050-5
         
        
        
            DOI : 
10.1109/ISCAS.1991.176200