• DocumentCode
    2825427
  • Title

    Productivity modeling of semiconductor manufacturing equipment

  • Author

    Pool, Mark ; Bachrach, Robert

  • Author_Institution
    Appl. Mater. Inc., Santa Clara, CA, USA
  • Volume
    2
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    1423
  • Abstract
    Optimizing a semiconductor wafer fab requires balancing technology and productivity. Recent work on productivity modeling is described and the authors focus on discrete event simulation models of unitary tool, modules, and whole fab. In addition, some related cost-modeling aspects are presented. The Applied Materials Turbo Modules Environment is reviewed. Turbo-Modules Unitary Tool Models (UTM) were developed for determining a configured tool´s performance, and the Tool Group Models (TGM) were developed for exploring module and fab modeling. Turbo-Modules is based on AutoSimulations, Inc. (ASI) AutoSched AP´s open architecture and a customized graphical user interface (GUI). The presentation provides a case study performed to analyze the loss of accuracy in a tool group model by modeling unitary tools as black box. Some fab cost modeling is discussed
  • Keywords
    discrete event simulation; electronic engineering computing; graphical user interfaces; production control; production engineering computing; semiconductor device manufacture; Applied Materials Turbo Modules Environment; AutoSimulations; AutoSimulations AutoSched AP open architecture; Tool Group Models; Turbo-Modules Unitary Tool Models; black box; customised graphical user interface; discrete event simulation models; productivity modeling; semiconductor manufacturing equipment; semiconductor wafer fabrication optimisation; Costs; Discrete event simulation; Graphical user interfaces; Performance analysis; Productivity; Semiconductor device manufacture; Semiconductor device modeling; Semiconductor materials; Turing machines; Virtual manufacturing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation Conference, 2000. Proceedings. Winter
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    0-7803-6579-8
  • Type

    conf

  • DOI
    10.1109/WSC.2000.899120
  • Filename
    899120