DocumentCode :
2825449
Title :
Alternative loading and dispatching policies for furnace operations in semiconductor manufacturing: a comparison by simulation
Author :
Akçali, Elif ; Uzsoy, Reha ; Hiscock, David G. ; Moser, Anne L. ; Teyner, Timothy J.
Author_Institution :
Sch. of Ind. Eng., Purdue Univ., West Lafayette, IN, USA
Volume :
2
fYear :
2000
fDate :
2000
Firstpage :
1428
Abstract :
In semiconductor manufacturing, furnaces are used for diffusion and deposition operations. A furnace is a batch processing machine, which can simultaneously process a number of lots together as a batch. Whenever a furnace becomes available, scheduling the next batch involves decisions on both which operation to process next (dispatching policy) and how many lots to put into the batch (loading policy). A simulation model of a wafer fabrication facility is used to examine the effects of different loading and dispatching policies for diffusion operations. Results indicate that the loading policy has a significant effect on the average diffusion flow time as well as the overall cycle time of the products, whereas dispatching policy has a less significant effect. We show that the production volume of a product should be considered in setting the minimum number of lots needed to start a batch. We suggest that the diffusion flow time for a low volume product can be reduced by releasing the product in batches or by setting the minimum batch size such that the work-in-process of the product can be moved faster
Keywords :
batch processing (industrial); chemical vapour deposition; diffusion; digital simulation; electronic engineering computing; furnaces; production control; production engineering computing; semiconductor device manufacture; average diffusion flow time; batch processing machine; batch scheduling; deposition operations; diffusion operations; dispatching policies; furnace operations; loading policies; overall cycle time; production volume; semiconductor manufacturing; simulation mode; wafer fabrication facility; Dispatching; Fabrication; Furnaces; Industrial engineering; Job shop scheduling; Production; Semiconductor device manufacture; Semiconductor device modeling; Temperature; Virtual manufacturing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Simulation Conference, 2000. Proceedings. Winter
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-6579-8
Type :
conf
DOI :
10.1109/WSC.2000.899121
Filename :
899121
Link To Document :
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