• DocumentCode
    2825697
  • Title

    A simulation-based cost modeling methodology for evaluation of interbay material handling in a semiconductor wafer fab

  • Author

    Murray, Shari ; Mackulak, Gerald T. ; Fowler, John W. ; Colvin, Theron

  • Author_Institution
    Dept. of Ind. Eng., Arizona State Univ., Tempe, AZ, USA
  • Volume
    2
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    1510
  • Abstract
    In the next generation of semiconductor wafer fabrication facilities, decisions concerning material handling systems will be a major factor in initial facility cost, operational cost, production cycle times and possibly product yield percentages. The wafers will increase in diameter to 300 mm and a new front opening unified pod (FOUP) has been designed to carry them, both increasing the weight of a production lot. This increase requires substantial automation for ergonomic and quality reasons. As a result, semiconductor manufacturers are asking, “what level of automation is financially justifiable?” Automation suppliers have stated that automation saves money, but have as yet not produced a sufficiently detailed financial analysis proving their premise. In this paper, both a fully automated and a manual material handling system are simulated and compared in a thorough cost analysis. Sensitivity analysis is performed on inflation rate, interest rate, die price, wafer start rate, and yield percentage to validate the results of the analyses
  • Keywords
    computer integrated manufacturing; costing; digital simulation; financial data processing; materials handling; semiconductor device manufacture; die price; ergonomics; facility cost; financial analysis; front opening unified pod; inflation rate; interbay material handling; interest rate; operational cost; product yield percentages; production cycle times; semiconductor manufacturing simulation; semiconductor wafer fabrication; sensitivity analysis; simulation-based cost modeling; wafer start rate; Analytical models; Costs; Ergonomics; Fabrication; Manufacturing automation; Materials handling; Production systems; Semiconductor device manufacture; Semiconductor device modeling; Sensitivity analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Simulation Conference, 2000. Proceedings. Winter
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    0-7803-6579-8
  • Type

    conf

  • DOI
    10.1109/WSC.2000.899133
  • Filename
    899133