DocumentCode
2825697
Title
A simulation-based cost modeling methodology for evaluation of interbay material handling in a semiconductor wafer fab
Author
Murray, Shari ; Mackulak, Gerald T. ; Fowler, John W. ; Colvin, Theron
Author_Institution
Dept. of Ind. Eng., Arizona State Univ., Tempe, AZ, USA
Volume
2
fYear
2000
fDate
2000
Firstpage
1510
Abstract
In the next generation of semiconductor wafer fabrication facilities, decisions concerning material handling systems will be a major factor in initial facility cost, operational cost, production cycle times and possibly product yield percentages. The wafers will increase in diameter to 300 mm and a new front opening unified pod (FOUP) has been designed to carry them, both increasing the weight of a production lot. This increase requires substantial automation for ergonomic and quality reasons. As a result, semiconductor manufacturers are asking, “what level of automation is financially justifiable?” Automation suppliers have stated that automation saves money, but have as yet not produced a sufficiently detailed financial analysis proving their premise. In this paper, both a fully automated and a manual material handling system are simulated and compared in a thorough cost analysis. Sensitivity analysis is performed on inflation rate, interest rate, die price, wafer start rate, and yield percentage to validate the results of the analyses
Keywords
computer integrated manufacturing; costing; digital simulation; financial data processing; materials handling; semiconductor device manufacture; die price; ergonomics; facility cost; financial analysis; front opening unified pod; inflation rate; interbay material handling; interest rate; operational cost; product yield percentages; production cycle times; semiconductor manufacturing simulation; semiconductor wafer fabrication; sensitivity analysis; simulation-based cost modeling; wafer start rate; Analytical models; Costs; Ergonomics; Fabrication; Manufacturing automation; Materials handling; Production systems; Semiconductor device manufacture; Semiconductor device modeling; Sensitivity analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Simulation Conference, 2000. Proceedings. Winter
Conference_Location
Orlando, FL
Print_ISBN
0-7803-6579-8
Type
conf
DOI
10.1109/WSC.2000.899133
Filename
899133
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