Mixed-signal LSI relationship among measurement accuracy, yield, and test time

Author

Kohinata, Hideo ; Arai, Manabu ; Fukumoto, Satoshi ; Iwasaki, Kazuhiko

Author_Institution

Agilent Technol., Inc., Japan

fYear

2004

fDate

38102

Firstpage

43

Lastpage

45

Abstract

As the degree of LSI integration is becoming rapidly greater and circuit size is becoming bigger, the bigger LSI test cost due to longer test time in LSI production becomes more serious. This paper discusses how much impact mixed LSI measurement accuracy improvement affects test time and LSI yield by analyzing the test results in a production test. It is a practical and effective example for the semiconductor industry to show the relationship among measurement accuracy, test time, and yield based on the actual test data.

Keywords

integrated circuit measurement; integrated circuit testing; integrated circuit yield; large scale integration; mixed analogue-digital integrated circuits; LSI integration; LSI measurement; LSI production; LSI test; circuit size; measurement accuracy; measurement test time; measurement yield; mixed-signal LSI relationship; production test; semiconductor industry; Circuit testing; DVD; Distortion measurement; Frequency; Integrated circuit measurements; Large scale integration; Noise measurement; Signal processing; Signal to noise ratio; Time measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Current and Defect Based Testing, 2004. DBT 2004. Proceedings. 2004 IEEE International Workshop on

Print_ISBN

0-7803-8950-6

Type

conf

DOI

10.1109/DBT.2004.1408952

Filename

1408952