Title :
Mixed-signal LSI relationship among measurement accuracy, yield, and test time
Author :
Kohinata, Hideo ; Arai, Manabu ; Fukumoto, Satoshi ; Iwasaki, Kazuhiko
Author_Institution :
Agilent Technol., Inc., Japan
Abstract :
As the degree of LSI integration is becoming rapidly greater and circuit size is becoming bigger, the bigger LSI test cost due to longer test time in LSI production becomes more serious. This paper discusses how much impact mixed LSI measurement accuracy improvement affects test time and LSI yield by analyzing the test results in a production test. It is a practical and effective example for the semiconductor industry to show the relationship among measurement accuracy, test time, and yield based on the actual test data.
Keywords :
integrated circuit measurement; integrated circuit testing; integrated circuit yield; large scale integration; mixed analogue-digital integrated circuits; LSI integration; LSI measurement; LSI production; LSI test; circuit size; measurement accuracy; measurement test time; measurement yield; mixed-signal LSI relationship; production test; semiconductor industry; Circuit testing; DVD; Distortion measurement; Frequency; Integrated circuit measurements; Large scale integration; Noise measurement; Signal processing; Signal to noise ratio; Time measurement;
Conference_Titel :
Current and Defect Based Testing, 2004. DBT 2004. Proceedings. 2004 IEEE International Workshop on
Print_ISBN :
0-7803-8950-6
DOI :
10.1109/DBT.2004.1408952
