Fault diagnosis of a GHz CMOS LNA using high-speed ADC-based BIST

Author

Liobe, John ; Margala, Martin

Author_Institution

Dept. of Electr. & Comput. Eng., Rochester Univ., NY, USA

fYear

2004

fDate

38102

Firstpage

85

Lastpage

89

Abstract

This paper presents a fault isolation method using the digital signatures from a LNA BIST solution. The fault localization capabilities of the functional test and data analysis methods are demonstrated by circuit level simulation. Also a discussion of the efficacy of this method is given. Results showed that only 16% of the resistive faults examined here cannot be mapped to its specification location in the LNA.

Keywords

CMOS integrated circuits; amplifiers; analogue-digital conversion; built-in self test; fault simulation; integrated circuit testing; CMOS LNA; LNA BIST solution; analog-to-digital converter; circuit level simulation; data analysis methods; fault diagnosis; fault isolation method; fault localization; functional test; high-speed ADC-based BIST; low-noise amplifier; resistive faults; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Digital signatures; Fault diagnosis; Performance evaluation; RF signals; Radio frequency; System testing;

fLanguage

English

Publisher

ieee

Conference_Titel

Current and Defect Based Testing, 2004. DBT 2004. Proceedings. 2004 IEEE International Workshop on

Print_ISBN

0-7803-8950-6

Type

conf

DOI

10.1109/DBT.2004.1408964

Filename

1408964