• DocumentCode
    2826064
  • Title

    Automatic test pattern generation for resistive bridging faults

  • Author

    Engelke, Piet ; Polian, Ilia ; Renovell, Michel ; Becker, Bernd

  • Author_Institution
    Albert-Ludwigs-Univ., Freiburg, Germany
  • fYear
    2004
  • fDate
    38102
  • Firstpage
    91
  • Lastpage
    96
  • Abstract
    An ATPG for resistive bridging faults is proposed that combines the advantages of section-based generation and interval-based simulation. In contrast to the solutions introduced so far, it can handle arbitrary non-feedback bridges between two nodes, including ones detectable at higher resistance and undetectable at lower resistance, and faults requiring more than one vector for detection.
  • Keywords
    automatic test pattern generation; fault simulation; integrated circuit testing; logic testing; ATPG; SAT; automatic test pattern generation; faults detection; interval-based simulation; nonfeedback bridge; resistive bridging faults; section-based generation; Automatic test pattern generation; Bridge circuits; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Logic testing; Marine animals; Roentgenium; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Current and Defect Based Testing, 2004. DBT 2004. Proceedings. 2004 IEEE International Workshop on
  • Print_ISBN
    0-7803-8950-6
  • Type

    conf

  • DOI
    10.1109/DBT.2004.1408965
  • Filename
    1408965
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2826064