Title :
Automatic test pattern generation for resistive bridging faults
Author :
Engelke, Piet ; Polian, Ilia ; Renovell, Michel ; Becker, Bernd
Author_Institution :
Albert-Ludwigs-Univ., Freiburg, Germany
Abstract :
An ATPG for resistive bridging faults is proposed that combines the advantages of section-based generation and interval-based simulation. In contrast to the solutions introduced so far, it can handle arbitrary non-feedback bridges between two nodes, including ones detectable at higher resistance and undetectable at lower resistance, and faults requiring more than one vector for detection.
Keywords :
automatic test pattern generation; fault simulation; integrated circuit testing; logic testing; ATPG; SAT; automatic test pattern generation; faults detection; interval-based simulation; nonfeedback bridge; resistive bridging faults; section-based generation; Automatic test pattern generation; Bridge circuits; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Logic testing; Marine animals; Roentgenium; Threshold voltage;
Conference_Titel :
Current and Defect Based Testing, 2004. DBT 2004. Proceedings. 2004 IEEE International Workshop on
Print_ISBN :
0-7803-8950-6
DOI :
10.1109/DBT.2004.1408965
