Study of resolution in microwave imaging using Linear Sampling Method

In any imaging technology, resolution is an important parameter of an imaging system which resolve two targets that produce a scattered field. According to Rayleigh criterion, the resolution of objects, in the far-field, is limited to 0.5 wavelength. In microwave imaging, study of resolution is required in many practical applications. Among many microwave imaging methods, Linear Sampling Method (LSM) is an efficient and reliable reconstruction method for finding the location and shape of the objects. In this paper, resolution between the two dielectric objects is studied under different frequencies using LSM and it is compared with Rayleigh criterion.