• DocumentCode
    2826270
  • Title

    Author index

  • fYear
    2004
  • fDate
    25-25 April 2004
  • Firstpage
    113
  • Lastpage
    113
  • Abstract
    The author index contains an entry for each author and coauthor included in the proceedings record.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Current and Defect Based Testing, 2004. DBT 2004. Proceedings. 2004 IEEE International Workshop on
  • Conference_Location
    Napa Valley, CA
  • Print_ISBN
    0-7803-8950-6
  • Type

    conf

  • DOI
    10.1109/DBT.2004.1408972
  • Filename
    1408972
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2826270