Title :
A novel AlGaN/GaN HEMTs technology for intelligent electric network application
Author :
Huang, Wei ; Wang, Sheng ; Wan, Qing ; Hu, Nanzhong ; Wang, Guangjian ; Zhang, Shudan
Author_Institution :
9th Dept., China Electron. Technol. Group Corp., Wuxi, China
Abstract :
The AlGaN/GaN HEMTs with source-terminated field plate was firstly fabricated, employing by CF4 plasma treatment for enhancement-mode (E-mode). The results showed that by adding LGD from 5 um to 15 um, the breakdown voltage of the device was rapidly increased 350 V, whose value is from 50 V to 400 V while the threshold voltage of the device, VTH stayed about 0.5 V by the technology of CF4 plasma modulating electron sheet density of the channel. When the distance of source-terminated field plate, LFP was about 3 um, the breakdown voltage of the device was further improved because the electric field near the gate edge was effectively shielded. The breakdown voltage and the specific on-resistance for the device with the distance of LGD about 15um were about 475 V and about 2.9 m Ω · cm2 respectively. The results from RF measurement showed that with the variation of VGS, the fT and fMAX parameters of the device with source-terminated field plate were the order of Gigahertz frequency. The dynamic characteristic of E-mode power device was excellent and its forward current was about 80 mA. Therefore E-mode AlGaN/GaN technology was very suitable for the application of intelligent electric network.
Keywords :
III-V semiconductors; aluminium compounds; gallium compounds; high electron mobility transistors; intelligent networks; plasma materials processing; wide band gap semiconductors; AlGaN-GaN; CF4 plasma modulating electron sheet density; CF4 plasma treatment; E-mode power device; HEMT technology; device breakdown voltage; gate edge; gigahertz frequency; intelligent electric network; intelligent electric network application; size 5 mum to 15 mum; source-terminated field plate; voltage 50 V to 400 V; Gallium nitride; HEMTs; Junctions; Plasma measurements; RNA; Radio frequency; AlGaN/GaN HEMTs; CF4 plasma treatment; Enhancement-mode (E-mode); High breakdown voltage; intelligent electric network;
Conference_Titel :
Computer Application and System Modeling (ICCASM), 2010 International Conference on
Conference_Location :
Taiyuan
Print_ISBN :
978-1-4244-7235-2
Electronic_ISBN :
978-1-4244-7237-6
DOI :
10.1109/ICCASM.2010.5619986