Application of test structures for monitoring of high frequency characteristics of organic substrate materials

Author

Salhi, Faical ; Sommer, Grit ; John, Werner ; Reichl, Herbert

Author_Institution

FhG-IZM, Berlin, Germany

fYear

2004

fDate

9-12 May 2004

Firstpage

67

Lastpage

70

Abstract

This paper introduces two basic test structures and its functionality for continuous determination of electrical properties of material as well as geometrical parameter of substrate designs. On the basis of a high frequency substrate with known characteristics, a method for determination of material properties in a frequency range of 1 GHz to at least 24 GHz is presented. Fundamental importance is attached to the relative permittivity. ε_Γ, and the dissipation factor, tanδ. High frequency measurements are compared to simulation results. Finally, the extracted material parameters are presented and discussed. Methods of line resonator and branch line coupler are compared concerning accuracy, sensitivity and manageability.

Keywords

microwave materials; microwave measurement; permittivity; strip line couplers; strip line resonators; substrates; 1 to 24 GHz; branch line coupler; dissipation factor; electrical properties; extracted material parameters; geometrical parameter; high frequency characteristics; high frequency measurements; high frequency substrate; line resonator; material properties; organic substrate materials; relative permittivity; substrate designs; test structures; Conducting materials; Feeds; Geometry; Material properties; Materials testing; Monitoring; Organic materials; Permittivity; Resonance; Resonant frequency;

fLanguage

English

Publisher

ieee

Conference_Titel

Signal Propagation on Interconnects, 2004. Proceedings. 8th IEEE Workshop on

Print_ISBN

0-7803-8470-9

Type

conf

DOI

10.1109/SPI.2004.1409006

Filename

1409006