Title :
Probability of Integrated Circuits Failures on Influence of Pulsed Radio-Wave Radiation
Author_Institution :
Radiotech. Inst., Russian Acad. of Sci., Moscow
Abstract :
A theoretical development of the damages accumulation model is presented. The probability and energy of IC damage is determined as a function of number of electromagnetic pulses N. This model qualitative describes the pulse repetition frequency dependence of failure probability and energy. It is necessary to change a model for quantitative coincidence with an experiment
Keywords :
electromagnetic pulse; integrated circuit reliability; probability; radiowaves; IC damage; electromagnetic pulse; failure energy; integrated circuits failure probability; pulse repetition frequency; pulsed radio-wave radiation; quantitative coincidence; Pulse circuits;
Conference_Titel :
Microwave and Telecommunication Technology, 2006. CriMiCO '06. 16th International Crimean Conference
Conference_Location :
Sevastopol, Crimea
Print_ISBN :
966-7968-92-8
Electronic_ISBN :
966-7968-92-8
DOI :
10.1109/CRMICO.2006.256172
