Title :
Influence of Pulsed Electromagnetic Fields Upon Integral Memory Microcircuit
Author :
Ahramovich, L. ; Gribski, M. ; Grigoriev, E. ; Zuev, S. ; Starostenko, V. ; Churyumov, G. ; Borisov, A. ; Petrov, A.
Author_Institution :
Vernadsky Tavrical Nat. Univ., Simferopol
Abstract :
The experimental study method of the direct influence by pulsed electromagnetic fields on modern microcircuits of the memories is described. The field values, under which the malfunction in the microcircuits working and degradation phenomena in microstructures element of the crystal and discharge of the microcircuits begin, are obtained
Keywords :
electromagnetic interference; electromagnetic pulse; integrated circuits; integral memory microcircuit; microstructure element; pulsed electromagnetic fields; EMP radiation effects; Electromagnetic fields; IEEE catalog; Microwave technology; Organizing;
Conference_Titel :
Microwave and Telecommunication Technology, 2006. CriMiCO '06. 16th International Crimean Conference
Conference_Location :
Sevastopol, Crimea
Print_ISBN :
966-7968-92-8
Electronic_ISBN :
966-7968-92-8
DOI :
10.1109/CRMICO.2006.256173
