Title :
Investigation of the Low-Loss Dielectric Materials in the Wide Temperature Range
Author :
Derkach, V. ; Golovashchenko, R. ; Goroshko, O. ; Nedukh, S. ; Tarapov, S.
Author_Institution :
Usikov Inst. of Radiophys. & Electron., Nat. Acad. of Sci., Kharkov
Abstract :
The operational regimes of cryodielectrometer designed for measurement the dielectric parameters of materials with small dissipation in millimeter waveband is described. Dependences of loss tangent on temperature for some dielectric and semiconductor materials in frequency band 40-80 GHz and temperature range 0.85-300 K are analyzed
Keywords :
cryogenics; dielectric loss measurement; dielectric materials; millimetre wave measurement; semiconductor materials; 0.85 to 300 K; 40 to 80 GHz; cryodielectrometer design; dissipation; low-loss dielectric material; millimeter waveband; parameters measurement; semiconductor material; Dielectric materials; Quadratic programming; Refrigeration; Temperature distribution;
Conference_Titel :
Microwave and Telecommunication Technology, 2006. CriMiCO '06. 16th International Crimean Conference
Conference_Location :
Sevastopol, Crimea
Print_ISBN :
966-7968-92-8
Electronic_ISBN :
966-7968-92-8
DOI :
10.1109/CRMICO.2006.256189
