DocumentCode :
2827433
Title :
The Layered Hemispherical Resonator for Dielectrometry
Author :
Prokopenko, Yu. ; Suvorova, O. ; Filippov, Yu.
Author_Institution :
Inst. for Radiophys. & Electron., Nat. Acad. of Sci., Kharkov
Volume :
2
fYear :
2006
fDate :
Sept. 2006
Firstpage :
760
Lastpage :
761
Abstract :
The characteristic equation for complex frequencies of layered dielectric resonator was obtained. The eigenfrequencies and Q-factors depending on diameter of inner layer at the presence of different substances are presented. The numerical investigations of whispering gallery modes of QDR are performed. The possibility of using such type of resonator as measuring cell for substances having both large and small losses is presented in this paper
Keywords :
Q-factor; dielectric resonators; eigenvalues and eigenfunctions; inhomogeneous media; whispering gallery modes; Q-factor; QDR; characteristic equation; dielectrometry; eigenfrequencies; layered hemispherical resonator; quasioptical dielectric resonator; whispering gallery mode; Dielectrics; Equations; Frequency; IEEE catalog; Microwave technology; Organizing; Permittivity; Petroleum; Q factor; Tin;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave and Telecommunication Technology, 2006. CriMiCO '06. 16th International Crimean Conference
Conference_Location :
Sevastopol, Crimea
Print_ISBN :
966-7968-92-8
Electronic_ISBN :
966-7968-92-8
Type :
conf
DOI :
10.1109/CRMICO.2006.256190
Filename :
4023472
Link To Document :
بازگشت