DocumentCode :
2827561
Title :
Measurements of Slow Relaxation Times of Ferroelectric Films by Means of Resonance Method
Author :
Kozyrev, A. ; Gaidukov, M. ; Gagarin, A. ; Altynnikov, A.
Author_Institution :
St-Petersburg Electrotech. Univ., St. Petersburg
Volume :
2
fYear :
2006
fDate :
Sept. 2006
Firstpage :
778
Lastpage :
779
Abstract :
Measurements of slow relaxation times of ferroelectric (FE) films by resonance method under periodical voltage pulses is considered. FE film-based varactors allows measuring at different pulse and pause time and provides sufficient accuracy
Keywords :
dielectric relaxation; dielectric resonance; ferroelectric thin films; ferroelectric films; periodical voltage pulses; resonance method; slow relaxation times measurement; Capacitance; Ferroelectric films; Helium; IEEE catalog; Iron; Microwave devices; Microwave technology; Organizing; Resonance; Varactors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave and Telecommunication Technology, 2006. CriMiCO '06. 16th International Crimean Conference
Conference_Location :
Sevastopol, Crimea
Print_ISBN :
966-7968-92-8
Electronic_ISBN :
966-7968-92-8
Type :
conf
DOI :
10.1109/CRMICO.2006.256197
Filename :
4023479
Link To Document :
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