Abstract :
Conference proceedings front matter may contain various advertisements, welcome messages, committee or program information, and other miscellaneous conference information. This may in some cases also include the cover art, table of contents, copyright statements, title-page or half title-pages, blank pages, venue maps or other general information relating to the conference that was part of the original conference proceedings.
Keywords :
VLSI; integrated circuit testing; ATPG; BIST; DFT; IDDQ testing; MCM; MEMS; VLSI testing; analog circuit; boundary scan testing; concurrent checking; core testing; deep submicron technology; defect oriented testing; delay fault testing; diagnosis; dynamic circuit; fault tolerance; high-level testing; high-speed circuit; memory testing; mixed signal circuit; on-line testing; scan path testing; validation; verification;
