Title :
Waveguide Dielectric Resonator Method for Measure Microwave Dielectric Films Properties
Author :
Kotelnikov, I. ; Buslov, O. ; Keis, V. ; Kozyrev, A.
Author_Institution :
Saint-Petersburg State Electro Tech. Univ., Saint Petersburg
Abstract :
The design principles for microwave ferroelectric (FE) films a properties (loss tangent, permittivity) measurement on the base of waveguide dielectric resonator (WDR) are developed. The results of FE films and LTCC measurements at frequency 30 GHz are presented
Keywords :
dielectric resonators; dielectric waveguides; ferroelectric thin films; microwave materials; microwave measurement; 30 GHz; WDR method; microwave ferroelectric films properties measurement; waveguide dielectric resonator; Dielectric films; Dielectric loss measurement; Dielectric measurements; Ferroelectric films; Ferroelectric materials; Iron; Loss measurement; Microwave measurements; Microwave theory and techniques; Permittivity measurement;
Conference_Titel :
Microwave and Telecommunication Technology, 2006. CriMiCO '06. 16th International Crimean Conference
Conference_Location :
Sevastopol, Crimea
Print_ISBN :
966-7968-92-8
Electronic_ISBN :
966-7968-92-8
DOI :
10.1109/CRMICO.2006.256200
