DocumentCode
2827785
Title
Analysis of terahertz zero bias detectors by using a triple-barrier resonant tunneling diode integrated with a self-complementary bow-tie antenna
Author
Suhara, Michihiko ; Takahagi, Satoshi ; Asakawa, Kiyoto ; Okazaki, Toshimichi ; Nakamura, Masahito ; Yamashita, Shin ; Itagaki, Yusuke ; Saito, Mitsufumi ; Tchegho, Anselme ; Keller, Gregor ; Poloczek, Artur ; Prost, Werner ; Tegude, Franz-Josef
Author_Institution
Grad. Sch. of Sci. & Eng., Tokyo Metropolitan Univ., Hachioji, Japan
fYear
2012
fDate
18-20 June 2012
Firstpage
77
Lastpage
78
Abstract
Recently, heavy emitter doping rather than decreasing the barrier thickness has boosted the peak current density of resonant tunneling diodes (RTDs) above 1,000 kA/cm2. Based on this achievement very mature InP-based RTD with current densities above 500 kA/cm2 are nowadays the leading solid-state THz device [1, 2]. Here, we show that even triple-barrier RTD (TBRTD) devices now reach a current density in excess of 250 kA/cm2 making this element ideally suited for rectification [3] but now at THz frequencies. Figure 1 is the state of art of THz detection sensitivity of previously reported zero bias detectors. Focusing on such zero bias broadband THz detection, we have also been studying on a design policy for a μm-sized on-chip self-complementally antenna and especially we have reported basic performances of a bow-tie antenna[4,5] integrated with a conventional homogeneous semiconductor mesa structure. However, it was still limited studies considering neither of actual nonlinear devices and peripheral circuits.
Keywords
bow-tie antennas; resonant tunnelling diodes; terahertz wave detectors; THz detection sensitivity; barrier thickness; broadband THz detection; heavy emitter doping; on-chip self-complementally antenna; peak current density; resonant tunneling diodes; self-complementary bow-tie antenna; solid-state THz device; terahertz zero bias detectors; triple-barrier RTD devices; triple-barrier resonant tunneling diode; Doping; Indium gallium arsenide; Indium phosphide; Substrates; Wideband;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference (DRC), 2012 70th Annual
Conference_Location
University Park, TX
ISSN
1548-3770
Print_ISBN
978-1-4673-1163-2
Type
conf
DOI
10.1109/DRC.2012.6256934
Filename
6256934
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