Title :
Analysis of terahertz zero bias detectors by using a triple-barrier resonant tunneling diode integrated with a self-complementary bow-tie antenna
Author :
Suhara, Michihiko ; Takahagi, Satoshi ; Asakawa, Kiyoto ; Okazaki, Toshimichi ; Nakamura, Masahito ; Yamashita, Shin ; Itagaki, Yusuke ; Saito, Mitsufumi ; Tchegho, Anselme ; Keller, Gregor ; Poloczek, Artur ; Prost, Werner ; Tegude, Franz-Josef
Author_Institution :
Grad. Sch. of Sci. & Eng., Tokyo Metropolitan Univ., Hachioji, Japan
Abstract :
Recently, heavy emitter doping rather than decreasing the barrier thickness has boosted the peak current density of resonant tunneling diodes (RTDs) above 1,000 kA/cm2. Based on this achievement very mature InP-based RTD with current densities above 500 kA/cm2 are nowadays the leading solid-state THz device [1, 2]. Here, we show that even triple-barrier RTD (TBRTD) devices now reach a current density in excess of 250 kA/cm2 making this element ideally suited for rectification [3] but now at THz frequencies. Figure 1 is the state of art of THz detection sensitivity of previously reported zero bias detectors. Focusing on such zero bias broadband THz detection, we have also been studying on a design policy for a μm-sized on-chip self-complementally antenna and especially we have reported basic performances of a bow-tie antenna[4,5] integrated with a conventional homogeneous semiconductor mesa structure. However, it was still limited studies considering neither of actual nonlinear devices and peripheral circuits.
Keywords :
bow-tie antennas; resonant tunnelling diodes; terahertz wave detectors; THz detection sensitivity; barrier thickness; broadband THz detection; heavy emitter doping; on-chip self-complementally antenna; peak current density; resonant tunneling diodes; self-complementary bow-tie antenna; solid-state THz device; terahertz zero bias detectors; triple-barrier RTD devices; triple-barrier resonant tunneling diode; Doping; Indium gallium arsenide; Indium phosphide; Substrates; Wideband;
Conference_Titel :
Device Research Conference (DRC), 2012 70th Annual
Conference_Location :
University Park, TX
Print_ISBN :
978-1-4673-1163-2
DOI :
10.1109/DRC.2012.6256934