Title :
A new test structure for measuring on-chip cross-coupling capacitances
Author :
Bogliolo, Alessandro ; Vair, Fabrizio ; Vendrame, Loris ; Bortesi, Luca
Author_Institution :
STI, Univ. di Urbino, Italy
Abstract :
We present a new test structure for measuring on-chip cross-coupling capacitance by means of crosstalk-induced supply currents. The key advantage of the proposed approach over existing charge-based capacitance measurements (CBCMs) based on cross talk is that the victim line is kept at a constant voltage level, thus avoiding short-circuit currents and enabling complete compensation of charge redistribution effects. We present preliminary experimental results obtained from a 0.13 μm CMOS implementation.
Keywords :
CMOS integrated circuits; capacitance measurement; crosstalk; integrated circuit measurement; integrated circuit testing; 0.13 micron; CMOS implementation; charge redistribution effects; charge-based capacitance measurements; constant voltage level; crosstalk-induced supply currents; on-chip cross-coupling capacitance measurement; test structure; Capacitance measurement; Charge measurement; Current measurement; Current supplies; Inverters; Periodic structures; Testing; Transducers; Voltage; Wiring;
Conference_Titel :
Signal Propagation on Interconnects, 2004. Proceedings. 8th IEEE Workshop on
Print_ISBN :
0-7803-8470-9
DOI :
10.1109/SPI.2004.1409041