DocumentCode :
2827945
Title :
Manifold Learning for Image Denoising
Author :
Shi, Rongjie ; Shen, I-Fan ; Chen, Wenbin ; Yang, Su
Author_Institution :
Fudan Univ., Shanghai
fYear :
2005
fDate :
21-23 Sept. 2005
Firstpage :
596
Lastpage :
602
Abstract :
This paper presents a novel scheme for image denoising. In spite of the sophistication of recently developed double-density discrete wavelet transforms (double-density DWTs), it still produces artifacts or destroys fine structures by blurring the data. Inspired by recent manifold learning methods, especially the locally linear embedding (LLE), we discover the underlying fact that image patches in noisy and denoised images construct manifolds with similar local geometry in these two distinct spaces. Therefore, we characterize local geometry by measuring how an image patch represented by a feature vector can be reconstructed by its nearest neighbors in feature space. Besides using the training image patches to construct the embedding, we also propose to overlap the target denoised image patches to satisfy local compatibility and smoothness constraints. In our method, double-density DWTs is incorporated with LLE for the purpose of denoising. The experimental results show that our method is flexible with noise type and achieves state-of-the-art performance particularly in terms of preserving the fine structures
Keywords :
computational geometry; discrete wavelet transforms; image denoising; learning (artificial intelligence); blurred data; double-density discrete wavelet transforms; feature vector; image denoising; local geometry; locally linear embedding; manifold learning method; training image patches; Discrete cosine transforms; Discrete wavelet transforms; Frequency; Gaussian noise; Geometry; Image denoising; Image reconstruction; Learning systems; Noise generators; Wiener filter;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer and Information Technology, 2005. CIT 2005. The Fifth International Conference on
Conference_Location :
Shanghai
Print_ISBN :
0-7695-2432-X
Type :
conf
DOI :
10.1109/CIT.2005.139
Filename :
1562718
Link To Document :
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