DocumentCode :
2827965
Title :
High performance III–V FETs for low power CMOS applications
Author :
Radosavljevic, M.
Author_Institution :
Technol. & Manuf. Group, Intel Corp., Hillsboro, OR, USA
fYear :
2012
fDate :
18-20 June 2012
Firstpage :
193
Lastpage :
194
Abstract :
III-V compound semiconductor based quantum well field effect transistors are in general viewed as a promising transistor candidate for future high-speed low-power logic applications due to their excellent drive current performance at low voltage. In this presentation, I will review recent device developments of n-channel InGaAs transistors. To start, well-studied Schottky gate device architecture is adopted to demonstrate integration on Si substrate [1] as well as to establish performance advantages over state-of-the-art Si NMOS at VCC=0.5V [2]. To enable further LG scaling, high quality high-K dielectric is integrated [3] and non-planar Tri-gate architecture is implemented [4]. I will conclude by discussing InSb based p-channel device results [5], as well as InGaAs based tunnel FETs [6].
Keywords :
CMOS integrated circuits; III-V semiconductors; Schottky gate field effect transistors; gallium arsenide; indium compounds; low-power electronics; semiconductor quantum wells; silicon; tunnel transistors; InGaAs; InSb; NMOS; Schottky gate device architecture; Si; drive current performance; field effect transistors; high quality high-K dielectric; low power CMOS applications; low power logic applications; nonplanar tri-gate architecture; semiconductor based quantum well; tunnel FET; voltage 0.5 V;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Device Research Conference (DRC), 2012 70th Annual
Conference_Location :
University Park, TX
ISSN :
1548-3770
Print_ISBN :
978-1-4673-1163-2
Type :
conf
DOI :
10.1109/DRC.2012.6256943
Filename :
6256943
Link To Document :
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