DocumentCode :
2827994
Title :
Interface Characterization by Second-Harmonic Microscopy
Author :
Florsheimer, M. ; Bosch, Marc ; Brillert, Ch. ; Fuchs, Henry
Author_Institution :
Physical Institute, University Of Miinster, Wilhelm-klemm-strabe 10, D-48 149 Miinster, Germany
fYear :
1996
fDate :
8-13 Sept. 1996
Firstpage :
30
Lastpage :
30
Keywords :
Cameras; Image reconstruction; Image resolution; Microscopy; Optical polarization; Optical scattering; Optical surface waves; Surface reconstruction; Tensile stress; Wavelet packets;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-optics Europe, 1996. CLEO/Europe., Conference on
Conference_Location :
Hamburg, Germany
Print_ISBN :
0-7803-3169-9
Type :
conf
DOI :
10.1109/CLEOE.1996.562007
Filename :
562007
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2827994
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