Title :
Techniques to encode and compress fault dictionaries
Author :
Chakravarty, Sreejit ; Gopal, Vinodh
Author_Institution :
Intel Corp., Santa Clara, CA, USA
Abstract :
Dictionary encoding schemes have not addressed the cost of reconstructing the dictionary during fault location. We show that by modifying a previously proposed dictionary encoding scheme only small portions of the information need be reconstructed during fault location. This provides a mechanism to reduce the number of secondary accesses during fault location. For pass-fail dictionaries, we present a simplified encoding scheme that reduces both the secondary storage requirement as well as the number of secondary accesses. A novel dictionary structure, known as hybrid dictionaries, which retains the full resolution with respect to modeled faults is presented. Heuristics to compute such dictionaries, its usefulness and how such dictionaries can be encoded for quick information retrieval are discussed
Keywords :
combinational circuits; data compression; data structures; digital integrated circuits; encoding; fault location; integrated circuit testing; integrated logic circuits; logic testing; sequential circuits; dictionary encoding schemes; fault diagnosis; fault dictionaries; fault dictionary compression; fault location; heuristics; hybrid dictionaries; pass-fail dictionaries; secondary accesses reduction; secondary storage requirement reduction; Circuit faults; Circuit testing; Costs; Data mining; Data structures; Dictionaries; Encoding; Fault diagnosis; Fault location; Information retrieval;
Conference_Titel :
VLSI Test Symposium, 1999. Proceedings. 17th IEEE
Conference_Location :
Dana Point, CA
Print_ISBN :
0-7695-0146-X
DOI :
10.1109/VTEST.1999.766665