Specification back-propagation and its application to DC fault simulation for analog/mixed-signal circuits

Author

Huang, Jiun-Lang ; Pan, Chen-Yang ; Cheng, Kwang-Ting

Author_Institution

Dept. of Electr. & Comput. Eng., California Univ., Santa Barbara, CA, USA

fYear

1999

fDate

1999

Firstpage

220

Lastpage

225

Abstract

In this paper we present the specification backpropagation technique which enables one to derive the constraint of an internal functional block with respect to a given DC specification for an analog/mixed-signal system. Based on this technique, we implement an efficient fault simulator which reduces the required efforts by (1) removing undetectable faults from the fault list, and (2) performing fault simulation only locally for the fault block. Simulation results on an industrial design show a speedup factor of 7.2 with 98% correct classification of detected and undetected faults as compared with full-chip DC fault simulation

Keywords

analogue integrated circuits; automatic testing; backpropagation; circuit analysis computing; fault simulation; integrated circuit testing; mixed analogue-digital integrated circuits; DC fault simulation; analog circuits; fault simulator; internal functional block; mixed-signal circuits; specification backpropagation; Analog circuits; Application software; Circuit faults; Circuit simulation; Computational modeling; Computer simulation; Costs; Design optimization; Hip; Sufficient conditions;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Test Symposium, 1999. Proceedings. 17th IEEE

Conference_Location

Dana Point, CA

ISSN

1093-0167

Print_ISBN

0-7695-0146-X

Type

conf

DOI

10.1109/VTEST.1999.766669

Filename

766669