Title :
Modular TSC checkers for Bose-Lin and Bose codes
Author :
Kavousianos, X. ; Nikolos, D.
Author_Institution :
Dept. of Comput. Eng. & Inf., Patras Univ., Greece
Abstract :
It is well known that the most common errors in VLSI circuits are unidirectional in nature. Many applications need protection against up to t unidirectional errors, while some others against burst unidirectional errors. Bose-Lin codes are systematic t-unidirectional error detecting codes while Bose codes are burst unidirectional error detecting codes. In this paper we propose a modular method for designing double output checkers for Bose-Lin and Bose codes. The proposed checkers are Totally Self Checking (TSC) with respect to a realistic fault model including stuck-at, transistor stuck-open, transistor stuck-on, resistive bridging faults and breaks. The method is applicable to every code information length and the checkers are very compact and fast
Keywords :
VLSI; digital integrated circuits; error detection codes; integrated circuit testing; logic design; logic testing; Bose codes; Bose-Lin codes; VLSI circuits; breaks; burst unidirectional error detecting codes; burst unidirectional errors; double output checkers; modular TSC checkers; modular method; realistic fault model; resistive bridging faults; stuck-at faults; t-unidirectional error detecting codes; totally self checking type; transistor stuck-on faults; transistor stuck-open faults; Circuit faults; Design methodology; Protection; Very large scale integration;
Conference_Titel :
VLSI Test Symposium, 1999. Proceedings. 17th IEEE
Conference_Location :
Dana Point, CA
Print_ISBN :
0-7695-0146-X
DOI :
10.1109/VTEST.1999.766689
