DocumentCode :
2828401
Title :
Programmable embedded self-testing checkers for all-unidirectional error-detecting codes
Author :
Stroele, Albrecht P. ; Tarnick, Steffen
Author_Institution :
Inst. of Comput. Design & Fault Tolerance, Karlsruhe Univ., Germany
fYear :
1999
fDate :
1999
Firstpage :
361
Lastpage :
369
Abstract :
Code checkers monitor the outputs of a system in order to detect errors as soon as possible. The presented checker designs for m-out-of-n and Berger codes are well suited for use as embedded checkers since under very weak assumptions they are self-testing with respect to all single stuck-at faults and almost all combinational faults in a single cell. They are built from full adders and flip-flops and have a regular structure. The same checker circuit can be employed for m-out-of-n codes with different values of m. Also, the same circuit can be used for different types of Berger codes. The specific code is determined by the initialization of the checker register
Keywords :
VLSI; adders; clocks; error detection codes; fault diagnosis; flip-flops; logic testing; programmable circuits; Berger codes; all-unidirectional error-detecting codes; checker register; combinational faults; flip-flops; full adders; m-out-of-n codes; programmable embedded self-testing checkers; single stuck-at faults; Adders; Built-in self-test; Circuit faults; Computer errors; Computerized monitoring; Fault tolerance; Flip-flops; Read only memory; Registers; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 1999. Proceedings. 17th IEEE
Conference_Location :
Dana Point, CA
ISSN :
1093-0167
Print_ISBN :
0-7695-0146-X
Type :
conf
DOI :
10.1109/VTEST.1999.766690
Filename :
766690
Link To Document :
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