DocumentCode :
2828404
Title :
Sub-Wavelength Microscopy
Author :
Tychinsky, V.
Author_Institution :
Moscow Institute For Radioengineering, Electronics and Automation, Vernadsky Pr 78, 117454 Russia
fYear :
1996
fDate :
8-13 Sept. 1996
Firstpage :
31
Lastpage :
31
Keywords :
Bandwidth; Dielectric substrates; Gratings; Microscopy; Optical filters; Optical resonators; Optical sensors; Optical waveguides; Resonance; Semiconductor waveguides;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-optics Europe, 1996. CLEO/Europe., Conference on
Conference_Location :
Hamburg, Germany
Print_ISBN :
0-7803-3169-9
Type :
conf
DOI :
10.1109/CLEOE.1996.562009
Filename :
562009
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2828404
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