Title : 
Weight-based codes and their application to concurrent error detection of multilevel circuits
         
        
            Author : 
Das, Debaleena ; Touba, Nur A.
         
        
            Author_Institution : 
Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
         
        
        
        
        
        
            Abstract : 
This paper proposes a new class of codes termed “weight-based codes” where each output bit is assigned a weight and the check bits represent the stem of the weights of the output bits which have value “1”. A Berger code is a special member of this proposed class of codes where each output bit is assigned a weight of one. This paper describes the application of these codes for the efficient on-line error detection of arbitrary multilevel circuits. The overall probability of detecting any number of erroneous bits at the output caused by a single internal fault is shown to be higher for weight-based codes than standard error detecting codes. Further, a very efficient design exists for the checker. The checker is area and speed efficient, has low power consumption, and can be tested by a small set of incoming code words. There is always a tradeoff between the fault detection capability and area overhead requirement of an error detecting code. Weight-based codes present a controlled way of increasing the number of check bits to achieve a desired fault detection capability
         
        
            Keywords : 
VLSI; automatic testing; error detection codes; fault diagnosis; integrated circuit testing; logic testing; multivalued logic circuits; Berger code; area overhead requirement; check bits; concurrent error detection; fault detection capability; incoming code words; multilevel circuits; on-line error detection; power consumption; single internal fault; weight-based codes; Application software; Circuit faults; Circuit noise; Code standards; Computer errors; Costs; Electrical fault detection; Fault detection; Testing; Voltage;
         
        
        
        
            Conference_Titel : 
VLSI Test Symposium, 1999. Proceedings. 17th IEEE
         
        
            Conference_Location : 
Dana Point, CA
         
        
        
            Print_ISBN : 
0-7695-0146-X
         
        
        
            DOI : 
10.1109/VTEST.1999.766691