• DocumentCode
    2828498
  • Title

    Low-voltage ZnO double-gate thin film transistor circuits

  • Author

    Li, Yuanyuan V. ; Ramirez, J. Israel ; Sun, Kaige G. ; Jackson, Thomas N.

  • Author_Institution
    Center for Thin Film Devices & Mater. Res. Inst., USA
  • fYear
    2012
  • fDate
    18-20 June 2012
  • Firstpage
    239
  • Lastpage
    240
  • Abstract
    We report here double-gate ZnO thin film transistor (TFT) circuits with operation at low voltage. TFTs with low voltage operation have been reported previously, but often use very thin (few nm thick) gate dielectric which may limit manufacturability. Oxide semiconductor-based TFTs have been extensively studied as competitive candidates for next-generation display technology and other large-area electronics. For many applications, operation at voltages compatible with low-voltage CMOS is important. Doublegate TFTs are of interest because they allow threshold voltage tuning, improved device performance, and circuit applications like mixers. We have previously reported bottom-gate ZnO TFTs and circuits fabricated on glass and flexible polymeric substrates using plasma enhanced atomic layer deposition (PEALD). Here we report double-gate ZnO TFTs and circuits fabricated on glass substrates using PEALD with a maximum process temperature of 200 °C. Compared to bottom-gate ZnO TFTs, doublegate ZnO TFTs have higher mobility, and reduced substhreshold slope. In these devices, the top gate can be used to vary the bottom-gate threshold voltage by more than 4 V. This allows the logic transition point for circuits to be adjusted as desired and allows logic operation at low voltage. 15 stage double-gate ZnO TFT ring oscillators operate well with VDD = 1.2 V, ID = 32 μA, and propagation delay of 2.1 μs/stage.
  • Keywords
    II-VI semiconductors; atomic layer deposition; low-power electronics; plasma materials processing; thin film circuits; thin film transistors; zinc compounds; PEALD; ZnO; bottom-gate TFT; bottom-gate threshold voltage; circuit applications; current 32 muA; device performance; double-gate TFT ring oscillators; doublegate TFT; flexible polymeric substrates; glass substrates; large-area electronics; logic operation; logic transition point; low voltage operation; low-voltage CMOS; low-voltage double-gate thin film transistor circuits; next-generation display technology; oxide semiconductor-based TFT; plasma enhanced atomic layer deposition; process temperature; substhreshold slope; temperature 200 C; threshold voltage tuning; very thin gate dielectric; voltage 1.2 V; Inverters; Logic gates; Ring oscillators; Thin film transistors; Threshold voltage; Wet etching; Zinc oxide;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Device Research Conference (DRC), 2012 70th Annual
  • Conference_Location
    University Park, TX
  • ISSN
    1548-3770
  • Print_ISBN
    978-1-4673-1163-2
  • Type

    conf

  • DOI
    10.1109/DRC.2012.6256969
  • Filename
    6256969