DocumentCode :
2828498
Title :
Low-voltage ZnO double-gate thin film transistor circuits
Author :
Li, Yuanyuan V. ; Ramirez, J. Israel ; Sun, Kaige G. ; Jackson, Thomas N.
Author_Institution :
Center for Thin Film Devices & Mater. Res. Inst., USA
fYear :
2012
fDate :
18-20 June 2012
Firstpage :
239
Lastpage :
240
Abstract :
We report here double-gate ZnO thin film transistor (TFT) circuits with operation at low voltage. TFTs with low voltage operation have been reported previously, but often use very thin (few nm thick) gate dielectric which may limit manufacturability. Oxide semiconductor-based TFTs have been extensively studied as competitive candidates for next-generation display technology and other large-area electronics. For many applications, operation at voltages compatible with low-voltage CMOS is important. Doublegate TFTs are of interest because they allow threshold voltage tuning, improved device performance, and circuit applications like mixers. We have previously reported bottom-gate ZnO TFTs and circuits fabricated on glass and flexible polymeric substrates using plasma enhanced atomic layer deposition (PEALD). Here we report double-gate ZnO TFTs and circuits fabricated on glass substrates using PEALD with a maximum process temperature of 200 °C. Compared to bottom-gate ZnO TFTs, doublegate ZnO TFTs have higher mobility, and reduced substhreshold slope. In these devices, the top gate can be used to vary the bottom-gate threshold voltage by more than 4 V. This allows the logic transition point for circuits to be adjusted as desired and allows logic operation at low voltage. 15 stage double-gate ZnO TFT ring oscillators operate well with VDD = 1.2 V, ID = 32 μA, and propagation delay of 2.1 μs/stage.
Keywords :
II-VI semiconductors; atomic layer deposition; low-power electronics; plasma materials processing; thin film circuits; thin film transistors; zinc compounds; PEALD; ZnO; bottom-gate TFT; bottom-gate threshold voltage; circuit applications; current 32 muA; device performance; double-gate TFT ring oscillators; doublegate TFT; flexible polymeric substrates; glass substrates; large-area electronics; logic operation; logic transition point; low voltage operation; low-voltage CMOS; low-voltage double-gate thin film transistor circuits; next-generation display technology; oxide semiconductor-based TFT; plasma enhanced atomic layer deposition; process temperature; substhreshold slope; temperature 200 C; threshold voltage tuning; very thin gate dielectric; voltage 1.2 V; Inverters; Logic gates; Ring oscillators; Thin film transistors; Threshold voltage; Wet etching; Zinc oxide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Device Research Conference (DRC), 2012 70th Annual
Conference_Location :
University Park, TX
ISSN :
1548-3770
Print_ISBN :
978-1-4673-1163-2
Type :
conf
DOI :
10.1109/DRC.2012.6256969
Filename :
6256969
Link To Document :
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