DocumentCode :
2828646
Title :
Instruction-driven wake-up mechanisms for Snoopy TAP controller
Author :
Bhattacharya, Debashis
Author_Institution :
Converter Product Dev. Center, Texas Instrum. Inc., Dallas, TX, USA
fYear :
1999
fDate :
1999
Firstpage :
467
Lastpage :
472
Abstract :
The issue of handling multiple embedded 1149.1-compliant TAP controllers (as part of embedded cores) in a 1149.1-compliant IC, has received significant attention, in recent times. The Hierarchical TAP (HTAP) architecture, previously developed by this author, provides a systematic solution to this problem, by allowing multiple embedded TAPs to share one set of 1149.1-specified test pins on the IC. The HTAP architecture requires an augmented version of the 1149.1-specified TAP-designated the Snoopy TAP (SNTAP)-in the top-level of the design hierarchy, that handles 1149.1-specified TAP functions for the non-TAP´ed parts of the IC, and performs arbitration of the shared IC pins between multiple embedded TAPs. Previously, a mechanism was developed to wake up the SNTAP using a simple string of constant values (0 or 1) on the TMS input. Two new mechanisms to wake up SNTAP by means of an instruction scanned in, are described in this report. Both mechanisms allow embedded 1149.1-compliant TAP´s to be used in a hierarchical design, as is, without any hardware modification. Moreover, both mechanisms enable reuse of the test program from the embedded TAP´ed cores, without any modification. The instructions to wake up the SNTAP-to switch access to different TAP-ed cores-can be simply inserted in-between the test programs for the embedded cores
Keywords :
application specific integrated circuits; design for testability; embedded systems; instruction sets; integrated circuit testing; microcontrollers; 1149.1-specified test pins; SNTAP; Snoopy TAP controller; arbitration; design hierarchy; hierarchical design; instruction-driven wake-up mechanisms; multiple embedded 1149.1-compliant TAP controllers; test program; Instruments; Integrated circuit testing; Joining processes; Performance evaluation; Pins; Product development; Switches; System testing; Tin; Traffic control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 1999. Proceedings. 17th IEEE
Conference_Location :
Dana Point, CA
ISSN :
1093-0167
Print_ISBN :
0-7695-0146-X
Type :
conf
DOI :
10.1109/VTEST.1999.766705
Filename :
766705
Link To Document :
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