DocumentCode
2828662
Title
THz detector based on proximity effect of topological insulator
Author
Li, Xiaodong ; Semenov, Yuriy G. ; Kim, Ki Wook
Author_Institution
Dept. of Electr. & Comput. Eng., North Carolina State Univ., Raleigh, NC, USA
fYear
2012
fDate
18-20 June 2012
Firstpage
111
Lastpage
112
Abstract
Designing THz detectors that operate at room temperature is highly desirable and challenging for practical applications, such as imaging and quality control. Since the THz photon energy is very close to the thermal excitation, the room temperature operation is very restricted in conventional devices. In contrast, the topological insulators (TIs), e.g. Bi2Se3, pave a way to a new paradigm in low energy optoelectronics due to unique electronic properties of surface electrons. In this work, we analyze THz photodetectors based on the proximity effect in the hybrid TI- ferromagnetic insulator (FMI) structure (Fig.1). The predicted photocurrent of the unit cell can reach the order of 10-7A·cm/W, which is of practical importance. Moreover, the sensitivity of the proposed devices can be extended beyond the thermal limit, since the output signal can be readily distinguishable from the background thermal excitation for signals in THz/far infrared frequency domain even at room temperature.
Keywords
optoelectronic devices; photodetectors; terahertz wave detectors; THz photodetectors; THz photon energy; THz-far infrared frequency domain; background thermal excitation; hybrid TI-FMI structure; hybrid TI-ferromagnetic insulator structure; low energy optoelectronics; quality control; surface electron electronic properties; temperature 293 K to 298 K; thermal excitation; topological insulator proximity effect; unit cell photocurrent; Frequency measurement; Insulators; Photonics;
fLanguage
English
Publisher
ieee
Conference_Titel
Device Research Conference (DRC), 2012 70th Annual
Conference_Location
University Park, TX
ISSN
1548-3770
Print_ISBN
978-1-4673-1163-2
Type
conf
DOI
10.1109/DRC.2012.6256977
Filename
6256977
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