DocumentCode :
2828723
Title :
Author index
fYear :
1999
fDate :
29-29 April 1999
Firstpage :
495
Lastpage :
496
Abstract :
The author index contains an entry for each author and coauthor included in the proceedings record.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 1999. Proceedings. 17th IEEE
Conference_Location :
Dana Point, CA, USA
ISSN :
1093-0167
Print_ISBN :
0-7695-0146-X
Type :
conf
DOI :
10.1109/VTEST.1999.766711
Filename :
766711
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2828723
