DocumentCode
2828723
Title
Author index
fYear
1999
fDate
29-29 April 1999
Firstpage
495
Lastpage
496
Abstract
The author index contains an entry for each author and coauthor included in the proceedings record.
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 1999. Proceedings. 17th IEEE
Conference_Location
Dana Point, CA, USA
ISSN
1093-0167
Print_ISBN
0-7695-0146-X
Type
conf
DOI
10.1109/VTEST.1999.766711
Filename
766711
Link To Document