Title :
Neural network based technique for detecting catastrophic and parametric faults in analog circuits
Author :
Mosin, Sergey G.
Author_Institution :
Vladimir State Univ., Russia
Abstract :
The approach to transient functional test of analog circuits is considered. The artificial neural network is proposed for realization of the circuit under test (CUT) response analysis. The coefficients of wavelet decomposition of CUT transient output responses reflecting the dynamical behavior of analog circuit are used for neural network training sensitivity analysis is applied for selecting the test frequencies and test nodes. The experimental results for analog benchmark circuits are provided.
Keywords :
analogue circuits; circuit analysis computing; circuit testing; fault diagnosis; neural nets; sensitivity analysis; transient response; wavelet transforms; analog circuits; artificial neural network; catastrophic fault detection; circuit under test response analysis; parametric fault detection; sensitivity analysis; transient functional testing; wavelet decomposition; Analog circuits; Artificial neural networks; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Neural networks; Sensitivity analysis; Transient analysis; Wavelet analysis;
Conference_Titel :
Systems Engineering, 2005. ICSEng 2005. 18th International Conference on
Print_ISBN :
0-7695-2359-5
DOI :
10.1109/ICSENG.2005.58
